In an article entitled, “Introgression of a 4D chromosomal fragment into durum wheat confers aluminium tolerance,” published in the July issue of Annals of Botany, Chang Han1, Peter R. Ryan1, ZeHong Yan and Emmanuel Delhaize reported enhanced Al3+ tolerance in sister lines derived from the third backcross. They showed that the 4D chromosomal fragment substantially enhanced Al3+ tolerance. Their study indicated that the chromosomal fragment possesses the Kna1 salt tolerance locus. The Al3+tolerance of an elite durum cultivar was enhanced by introgression of a chromosomal fragment from hexaploid wheat (Triticum aestivum) that possesses an Al3+ tolerance gene. Furthermore, the study revealed that introgressed fragment did not affect total grain yield, but reduced the weight of individual grains and that it is possible to increase substantially the Al3+tolerance of an elite durum wheat cultivar by introgression of a 4D chromosomal fragment.